Electronic device structures are getting increasingly smaller. And because they're smaller, they can tolerate only extremely low stimulus currents and voltages, which reduce measurable signals close to the noise floor. This technical note explores a new approach to making such low-level signal measurements, one that utilizes optimum sensitivity, noise rejection, and uninterrupted acquisition of data as a means to more confidently characterize such materials.
- Understand the limitations of DC and AC measurements
- Learn the advantages of combined DC + AC measurements
- Know how to capture dynamic data and avoid thermal errors
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